Identification of high yielding inbred lines resistant to late wilt disease caused by Harpophora maydis in maize

  • K. Aruna Kumar
  • E. Gangappa
  • S. Ramesh and D. S. Swamy

Abstract

Diseases are the major constraints in realizing the yield potential of maize. Late wilt disease (LWD) caused by Harpophora maydisis one of the recently reported and widely spreading diseases across the world. Identification of LWD resistant source is an economical and eco-friendly approach. An experiment was conducted to identify LWD resistant inbred lines by subjecting 290 inbred lines to artificial screening. The same set of lines were evaluated for yield and yield attributing traits separately. Inbred lines were subjected to screening by inoculating Harpophora maydis spore suspension to stalks. Disease severity and intensity were recorded in split opened stalks using a 1 - 9 scale. Estimates of yield and yield attributing traits were also recorded and 14 inbred lines with the disease score ≤4 were identified as resistant/tolerant. Two inbred lines namely, 78 and 32589 are both tolerant to LWD and best yielding lines which can serve as potential parents for developing hybrids.

Published
30-03-2021
How to Cite
Kumar, K. A., Gangappa, E., & Ramesh and D. S. Swamy, S. (2021). Identification of high yielding inbred lines resistant to late wilt disease caused by Harpophora maydis in maize. Electronic Journal of Plant Breeding, 12(1), 151-158. Retrieved from http://ejplantbreeding.org/index.php/EJPB/article/view/3374
Section
Research Article