Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench]

  • S. M. Surashe,
  • H. V. Kalpande,
  • Ashok Badignnavar,
  • Ambika More and T. R. Ganapathi


Sorghum is an important cereal crop, cultivated both in the kharif and rabi seasons. Especially rabi sorghum is known for its grain quality and is used exclusively for human consumption. The present study was undertaken to induce variability through physical and chemical mutagens for morphological and yield-contributing traits. A popular rabi sorghum variety, Parbhani Moti was initially irradiated with gamma rays (100-400 Gy), ethyl methane sulphonate (0.1- 0.4% EMS) and their combinations.  Based on the univariate analysis, mutants with early flowering (63days), mid tall (90 cm) and long panicles (21 cm) were identified across various mutagenic treatments in the M2 generation. Gamma ray and EMS combined treatment showed the highest grain yield (85 g/plant) with high SPAD values compared to the parent. A high heritability value of 74.6 % was observed for grain yield with genetic advances ranging from 1.22-19.96% across different treatments. Significant positive correlations between SPAD values and grain yield and panicle length were observed. Cluster analysis based on Euclidean distance grouped all the mutants into four clusters with those derived from gamma rays (400Gy) emerging as highly diverse. Promising mutants identified in this study would serve as genetic resources for recombination breeding.

Keywords: EMS, Grain yield, Gamma rays, Genetic variability, Induced mutations


How to Cite
Surashe, S., Kalpande, H., Badignnavar, A., & More and T. R. Ganapathi, A. (2022). Mutation induced phenotypic variation for yield traits in sorghum [Sorghum bicolor (L.) Moench]. Electronic Journal of Plant Breeding, 13(2), 312-318. Retrieved from
Research Article