Genetic variability and diversity analyses in Electron Beam and Gamma Ray induced mutants for yield attributing traits in Urdbean [Vigna mungo (L.)]

  • C. Vanniarajan and R. Chandirakala

Abstract

An investigation was carried out in Electron Beam and Gamma Ray induced thirty eight Urdbean mutants with two checks to explore the genetic variability and diversity. Based on the overall performance of yield attributing traits, mutants viz., ACM-014-021, ACM-015-015, ACM-015-011, ACM-015-025, ACM-015-026 and ACM-014-007 were found to be superior and could be used in breeding programme for advancing yield coupled with batter quality. High phenotypic and genotypic coefficients of variation were recorded towards single plant yield and peduncle length. High heritability along with high genetic advance was noticed for base length, peduncle length, clusters count per plant, pods count per plant and seed yield per plant. The experiment on correlation showed that seed yield per plant recorded high positive correlation with pods count per plant, pod length, clusters count per plant and seeds per pod. Genetic diversity analysis resulted in grouping of forty genotypes viz., 38 mutants and two varieties into two clusters. Cluster I had 16 mutant lines along with VBN (Bg) 4 variety and cluster II had 22 mutant lines along with MDU1 variety. D2 cluster analysis based on eleven quantitative characters resulted in five groups with cluster V containing maximum of sixteen mutants along with two check varieties   followed by clusters I with 15 mutants, cluster IV with three mutants and cluster II and III with two mutants each. The cluster per se performance revealed that cluster III  recorded the maximum mean values for branches per plant, clusters, pod numbers per plant, quantity of seeds per pod, test weight,  seed yield per plant and plant height. Cluster IV had the highest mean value for base length and pod length. Cluster I had the maximum peduncle length. As the mutants falling between cluster IV and V exhibited maximum inter-cluster distance, selection of parents could be made from these clusters for future breeding program.

Keywords: Variability, Association analysis, Diversity, Urdbean.

Published
01-07-2022
How to Cite
R. Chandirakala, C. V. and. (2022). Genetic variability and diversity analyses in Electron Beam and Gamma Ray induced mutants for yield attributing traits in Urdbean [Vigna mungo (L.)]. Electronic Journal of Plant Breeding, 13(2), 512-518. Retrieved from https://ejplantbreeding.org/index.php/EJPB/article/view/4189
Section
Research Article