Genetic studies on false smut disease resistance and yield components in rice (Oryza sativa. L)

DOI: 10.37992/2023.1401.013

  • N. Ramya Selvi, R. Saraswathi,
  • S. Geetha and C. Gopalakrishnan

Abstract

The present investigation was performed to explain the genetic variability and association parameters of twenty traits in 30 F1s involving six parents differing in resistance against false smut in rice. Breeding materials were evaluated at hotspot location viz., HREC, Gudalur. The ANOVA revealed significant differences among the studied variables. Higher PCV over other coefficients of variation suggest the role of environment in trait expression. Disease related traits viz., NIP, NIT, NIGPa, PIT, PIGPa and agronomic traits viz., TNFPa, NCGPa, SSP, PH, HGW and SPY showed high magnitude of values for GCV, heritability and GAM indicating the role of additive gene action. Hence, selection of these traits may be effective.  Correlation studies indicated that HGW and SPW showed positive significant association with SPY . Path analysis revealed that NIT, NIGPa, NIGP and PIP had negative direct effect and DFF, NPT, TNFPa, SSP, NSRPa and SPW had positive direct effect towards single plant yield.

Keywords: Rice, False smut resistance, Yield, Variability, Association analysis

Published
31-03-2023
How to Cite
N. Ramya Selvi, R. Saraswathi, S. Geetha and C. Gopalakrishnan

Genetic studies on false smut disease resistance and yield components in rice Oryza sativa. L

. 2023. Electronic Journal of Plant Breeding, 14 1, 96-106. Retrieved from https://ejplantbreeding.org/index.php/EJPB/article/view/4630
Section
Research Article